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Strengths and Limitations of Scanning Electron Microscopy (SEM)

Posted by Unknown at 11:25 PM

Strengths
There is arguably no other instrument with the breadth of applications in the study of good products that compares with the SEM. The SEM is important in all fields that need characterization of strong products. Though this contribution is most worried with geological programs, it is important to be aware that these purposes are a extremely smaller subset of the scientific and industrial programs that exist for this instrumentation. Most SEM\'s are comparatively straightforward to function, with user-pleasant \"intuitive\" interfaces. Quite a few purposes necessitate minimum sample preparing. For several programs, data acquisition is quick (much less than five minutes/image for SEI, BSE, spot EDS analyses.) Present day SEMs produce knowledge in digital formats, which are highly moveable.

Restrictions
Samples must be stable and they have to healthy into the microscope chamber. Greatest measurement in horizontal dimensions is normally on the buy of 10 cm, vertical dimensions are usually significantly more limited and almost never exceed 40 mm. For most instruments samples have to be steady in a vacuum on the buy of 10-five - ten-six torr. Samples probably to outgas at very low pressures (rocks saturated with hydrocarbons, \"wet\" samples these as coal, organic products or swelling clays, and samples most likely to decrepitate at reduced pressure) are unsuitable for examination in conventional SEM\'s. 
Nonetheless, \"minimal vacuum\" and \"environmental\" SEMs also exist, and lots of of these styles of samples can be systematically examined in these specialised instruments. EDS detectors on SEM\'s can not detect quite light components (H, He, and Li), and lots of instruments are unable to detect components with atomic figures a lot less than 11 (Na). Most SEMs use a good state x-ray detector (EDS), and even though these sensors are extremely rapidly and effortless to utilize, they have fairly very poor strength resolution and sensitivity to elements present in very low abundances when when compared to wavelength dispersive x-ray sensors (WDS) on most electron probe microanalyzers (EPMA). An electrically conductive coating must be utilized to electrically insulating samples for review in regular SEM\'s, unless the instrument is able of operation in a low vacuum mode.